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Method and system for image analysis

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专利名称:Method and system for image analysis发明人:Roger Zebaze,Eleanor Jean Mackie,Anne

Bohte,Aloys Mbala,Ali Ghasemzadeh,EgoSeeman

申请号:US15191079申请日:20160623公开号:US09566038B2公开日:20170214

专利附图:

摘要:A computer-implemented system and method for analyzing a samplecomprising a material of interest and at least first and second adjacent materials each

generally adjacent to the material of interest, the material of interest having a generallydifferent density from the at least first and second adjacent materials. The methodcomprises automatically defining a plurality of regions of interest within an image of thesample that includes a junction between the material of interest and the first adjacentmaterial and a junction between the material of interest and the second adjacentmaterial, each of the regions of interest having a width of one or more pixels or voxels;determining respective profiles of density, intensity or attenuation within the regions ofinterest, each of the respective profiles crossing the respective junctions; automaticallyidentifying the material of interest in the density profile; analyzing the profiles byautomatically defining, for each of the profiles, a series of sections of the respectiveprofile, each of the sections comprising at least first and second S-like portions of therespective profile, the first portion containing the junction between the material ofinterest and the first adjacent material, the second portion containing the junctionbetween the material of interest and the second adjacent material; and locating thejunction in each of the first portions, including: identifying the greatest difference invalues of the respective profile between an adjacent peak and trough in a segment of therespective profile that includes at least some of the material of interest and at leastsome of the first adjacent material; and locating a point of inflexion in the segment.

申请人:StraxCorp Pty Ltd

地址:Melbourne, Victoria AU

国籍:AU

代理机构:Merchant & Gould P.C.

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