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专利名称：APPARATUS AND METHOD RELATING TO
CHARGED PARTICLES
发明人：AITKEN, Derek申请号：EP99926600.0申请日：19990615公开号：EP1090411B1公开日：20061108
摘要：Apparatus for acting upon charged particles has particular application in a massanalysis apparatus. An array of elongate magnetic poles (311) extends longitudinally inthe direction of a longitudinal axis (350) of the array, the array having a symmetricalreference surface (320) containing the longitudinal axis and passing through the arraywith magnetic poles (311) on each side of the reference surface. Charged particles (314)enter into, or originate in, the field of the magnetic pole array at a position spaced fromthe said longitudinal axis (350). The array of magnetic poles is such as to provide betweenopposed poles (311A, 311B), an extended region of magnetic field in which the chargedmagnetic particles pass with a curved motion imposed thereon by the field, together withentry and exit regions (312A and 312B) which provide curved magnetic fields (312A, 312B),giving focusing or divergence of the beam of charged particles passing through thefringe field at an angle to the normal to the entry or exit region. The apparatus includesresolving means (332) for selecting a required species of particle from the beam byparameter dependent dispersion in a plane transverse to the reference surface (320), byfocusing of the beam of particles at different focal points (331) along the generaldirection of propagation of the beam (314).
申请人：SUPERION LTD
地址：GB
国籍：GB
代理机构：Laight, Martin Harvey
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