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专利名称：Apparatus and method for testing power
and ground pins on a semiconductorintegrated circuit
发明人：Alin Theodor Iacob申请号：US11148465申请日：20050608公开号：US07279921B1公开日：20071009
专利附图：
摘要：To achieve the foregoing, and in accordance with the purpose of the presentinvention, a method and apparatus for testing individual power and ground pins on a
semiconductor integrated circuit are disclosed. The method and apparatus includesorganizing the power pins of the die into a first group of power pins and a second groupof power pins. Each of the first group of power pins are then connected through a firstset of resistors to a first common node, and each of the second group of power pinsthrough a second set of resistors to a second common node respectively. A voltage isnext applied between the first and second nodes. The voltage at each of the first groupof pins is compared with a first threshold voltage and the voltage at each of the secondgroup of pins is compared with a second threshold voltage. Individual bad pins in the firstand second groups are identified based on the comparison.
申请人：Alin Theodor Iacob
地址：Sunnyvale CA US
国籍：US
代理机构：Beyer Weaver LLP
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