您好,欢迎来到华佗小知识。
搜索
您的当前位置:首页review in electroless electrochemical etching

review in electroless electrochemical etching

来源:华佗小知识
CurrentOpinioninSolidStateandMaterialsScience9(2005)73–83

Siliconnanostructuresfromelectrolesselectrochemicaletching

KurtW.Kolasinski

DepartmentofChemistry,UniversityofVirginia,P.O.Box400319,McCormickRoad,Charlottesville,VA22904-4319,UnitedStates

Abstract

RecentadvancesintheproductionofSinanostructuresfromelectrolessetchingarereviewed,includingstainetching,metal-assistedetchingandchemicalvapouretching.Abriefreviewoftheexplosioninapplicationsofporoussiliconoverthepast18monthsisalsogiven.Thestainfilmthatresultsfromtheetchingof(poly-orsingle-)crystallineSiiscomposedofaporousnetworkofnanocrystallinesilicon.Fewmechanisticstudiesofelectrolessetchinghavebeenperformed,butthemoreextensivelystudiedanodicetchingofsiliconinfluoridesolutionsprovidesmanycluesastohowporousfilmsareformed.Intriguingrecentresultshaveshownthatcontroloverthepropertiesofthefilmcanbeobtainedbyexercisingcontroloverthecompositionoftheetchant.Ó2006ElsevierLtd.Allrightsreserved.

Keywords:Stainetching;Poroussilicon;Nanostructure;HF;Nanowire

1.Introduction

Oneofthegreatchallengesofsolid-statephysicsistocontrolthebandstructureofphononsandelectronstoachievedesiredproperties:raisingtheTcandcriticalcur-rentofsuperconductors,producingsemiconductorswithwell-definedbandgaps,increasingtheefficiencyofthermo-electriccooling,alteringthecatalyticactivityofmetals,etc.Surfacescienceplaysafundamentalroleinaddressingthischallengebothinthatitprovidesameansforunderstand-ingtheunderlyinggrowthandetchingphenomena[1]thataffectthedesiredpropertyandinthatitprovidesasyn-theticmethodforproducingthematerialsthatexhibittheseproperties.Forexample,surfacetexturingisusedtoalignthegrainsofyttriumbariumcopperoxide(YBCO)insec-ond-generationsuperconductingwires.CVD[2–4]andMBE[5–7]areusedtoengineerthebandgapsofsemicon-ductingmultilayerstructures[6,8–12]toproduceanarrayofoptoelectronicdevices.DispersinggoldinnanoscaleclustersacrossanoxidesurfacetransformsthismostnobleofmetalsintooneofthefinestcatalystforCOoxidation[13].

E-mailaddress:Kolasinski@virginia.edu

1359-0286/$-seefrontmatterÓ2006ElsevierLtd.Allrightsreserved.doi:10.1016/j.cossms.2006.03.004

Intheworldofnanotechnology,therearetwograndschemesformakingstructuresanddevices:thetop-downandthebottom-upapproaches.Inaslightlyover-general-izedform,wecandefinethesetwoapproachesthusly:Thetop-downapproachrulestheroostintheproductionofintegratedcircuits.Itistheengineeringapproachthathasledustotheamazinglysuccessfulworldof$4billionfabs.Inthisworld,perfectionofindividualprocessingstepsissought.Onetriestokeeptheindividualstepssimplebutthecombinationisverycomplicated.Hundredsofstepsmaybeinvolved.Noamountofprocessingcomplex-ityistoogreataslongastheprocesscanbeturnedintoabatchjobthatcanberepeatedmillionsoftimesatlowcost.Makingalayerconsistsof,forinstance,takingaperfectlycleansiliconwaferinacleanroomenvironment,spincoat-ingapolymerresistontoit,bringinganintricatelydesignedmaskintocloseproximityoftheresist,exposingtheresistwithashortwavelengthphotonsources,chemicallytreatedtheexposedresisttoremoveeitherexposedorunexposedregionsofresist,applyingamaterialcomponenttothepat-ternthathasbeencreated,removingunwantedmaterialfromregionsoutsideofthepattern,rinse,lather,repeatforasmanyprocessingstepsasarerequired.Evensome-thingasseeminglysimpleas‘‘makingacleansiliconsur-face’’maytaketensofprocessingsteps.

74K.W.Kolasinski/CurrentOpinioninSolidStateandMaterialsScience9(2005)73–83

Inthebottom-upscenario,theprocessingstepsareessentiallyinfinitelycomplexbutrequiredlittleinterven-tiononthescientist’spart.Theideaistousechemistrytoperformerrorcheckingandcorrectingprocessesthatwillguidethemselvestotheendproduct:thedesiredstruc-ture.Theidealisinspiredbybiomimeticprocesses:selfassemblyandselforganization–theexploitationofnon-covalentinteractionstodirecttheformationofstructures.ItisinthisrealmthatwearetryingtocreateSinanostruc-turesbyelectrolessetching.Justhowfarcanwepushchemistrywithminimalprocessinterventiontoperformthetaskswewantsothattheprocessarrivesatarbitrarilycomplexstructures?

Specifictosilicon,turningbulkSiintonanocrystals[14,15]ornanocrystallinenetworks[16,17]changesSiintoabrilliantemitterinthevisiblebecauseoftheeffectsofquantumconfinement.Hencetherehasbeengreatinterestincontrollingandunderstandingtheformationofnano-crystallinesilicon[18].Wecanunderstandhowquantumconfinementincreasesthebandgapofananocrystallinesemiconductorbyanalogytotheparticleintheboxprob-lem.Asmallerboxleadstoagreaterspacingbetweenenergylevels,thusalargerbandgap.Poroussilicon(por-Si)isthemostintensivelystudiedvariantofnanocrystallinesilicon(nc-Si)andseveralreviewshavebeenpublishedregardingtheformation[19–21],properties[17,22,23],sur-facechemistry[24],andphotoluminescence(PL)[25–29]ofpor-Si.AmazingcontroloverporemorphologyhasbeendemonstratedbyGo¨seleandco-workers[30].

Electrochemicaletchingdifferentiatesitselffromchemi-caletchinginthatchargetransferisinvolvedintheformer.Hydroxideexhibitsbothchemicalandelectrochemicalpathways,whereasetchinginacidicfluorideisexclusivelyelectrochemical[1].Chemicaletchingofthetypeexten-sivelystudied,forinstance,byChabalandco-workerscanbeusedtoproducenearlyperfectlyflatandhydro-gen-terminatedSisurfaces[31–37].

Therearefourelectrochemicalroutestopor-Siallofwhichoccurinacidicfluoridesolutions:anodicetching,photoelectrochemicaletching,laser-assistedetchingandelectrolessetching.Theboundariesarenotcompletelydis-tinctandcombinedprocessesareknown.AnodicetchinginvolvestheattachmentofSi(theworkingelectrode)andacounterelectrode(usuallyPt)toapowersupply,whichisusedtoregulatethevoltageontheSicrystal.Theelectro-chemistrythatoccursiscontrolledbythevoltageandsolu-tioncomposition.Thisworksfineforp-typeSibutforn-typeSi,inadditiontoconnectingtheSiandcounterelec-trodetothepowersupply,freecarriersneedtobemadeavailablebyilluminationoftheSielectrode,hencethetermphotoelectrochemicaletching.Itispossibletodispensewiththepowersupplyandexternalcounterelectrode.ByirradiatingasmallspotonaSiwafer,freecarriersarepro-ducedandbandbendingisusedtoseparateholesfromelectrons.Inn-typeSi,holesareforcedtothesurfaceoftheirradiatedareaandpor-Siformsthere.Inp-typeSi,holesareforcedtotheunirradiatedareaandthatiswhere

por-Siformationoccurs[38].Mechanistically,thechemicaltransformationsthatoccurinthesethreetypesofetchingareverymuchthesame[*39].Inelectrolessetching,elec-trochemistryoccursspontaneouslywithouttheinterven-tionofapowersupplyorphotonsource.Threetypesofelectrolessetchingarereviewedhere:stainetching,metal-assistedetchingandchemicalvapouretching.

Stainetchingistheetchingthatresultsfromasolutioncomposedoffluorideandanoxidant.Inchemicalvapouretching,thevapourofsuchasolution,ratherthanthesolu-tionitselfisincontactwiththeSi.Inmetal-assistedetchingdepositedmetalparticlesarealsoinvolved.ElectrolessetchingofSitoformpor-Siisasimpleprocessthatrequirestheattachmentofnoelectrodesandcanbeperformedonobjectsofarbitraryshapeandsize.Nonetheless,theforma-tionofpor-Siviaelectrolessetchinghasreceivedmuchlesssystematicinvestigation[17,40].ThepreponderanceofworkhasconcentratedonuseofHFincombinationwithanitroxyoxidant,typicallyHNO3orNaNO2.Itwillbeshownthatthishasseverelylimitedtherangeoffilmsandtheirpropertiesandthattheuseofawiderrangeoffluoridecarriersandoxidantscanleadtogreatercontrolovermorphologyandproperties.

2.RecentadvancesinporoussiliconstructuresanddevicesWithinthepastyear,therehasbeenagreatproliferationofstudiesinvolvingpor-Siindevicestructures.Manyoftheseadvancesarechronicledintheproceedingsofthe4thInternationalConferenceonPorousSemiconductors–ScienceandTechnology(PSST-2004),whichwaspub-lishedin2005[41].Specificareasinwhichpor-Siisbeingimplementedtechnologicallyincludeoptoelectronics,sen-sors,massspectrometry,nanocrystalproduction,drugdelivery,biomaterials,fuelcellsandphotovoltaics.

EversinceCanham’sobservationofvisiblephotolumi-nescence[16]therehasbeengreatinterestinthepossibleapplicationofpor-Siinoptoelectronics[42].Theimplemen-tationofpor-Siinindustriallyrelevantprocesseshasproventobechallengingbutprogresscontinuestowardstheimple-mentationofSiphotonics[43]andtheoreticalunderstand-ingoftheelectronicstatesinnanocrystallineSi(nc-Si)continuestoadvance[44–46].Theproceedingsofthe2004SpringMeetingoftheEuropeanMaterialsResearchSoci-ety(E-MRS)titled‘‘Si-basedphotonics:towardstruemonolithicintegration’’makeforfascinatingreadingintotheadvancesmadeinpor-Si,nanocrystallineSiandSimul-tilayerstructuresforuseinwaveguides,photoniccrystals,opticalfilters,reflectors,photodetectors,lightemittingdevices,sensorsandevenlab-on-chipapplications.Tune-ablephotonicbandgapmaterialscanbemadefrompor-Sithatcanbethermallyorelectricallymodulated[47,48].Linnrosandco-workers[49,50]havemadegreatstridesinthefabricationofforestsoffree-standingSiquantumdottowers.Thehaveobserved[**51]thephotolumines-cencefromasingledotandfoundalinewidthasnarrowas2meVat35K,provingtheatomiclikenatureofthe

K.W.Kolasinski/CurrentOpinioninSolidStateandMaterialsScience9(2005)73–8375

emissionfromSinanocrystalsresultingfromquantumcon-finement.Thestudyofopticalgainandstimulatedemis-sioninnanocrystallineSicontinuestoattractmuchattention[52–55].Cloutieretal.[*56]havereportedthresh-oldbehaviour,opticalgain,longitudinalcavitymodesandlinewidthnarrowing,alongwithacollimatedfar-fieldpat-tern,allofwhichareindicativeofamplificationandstim-ulatedemissionat1278nmfromSipatternedwithanorderedarrayofnanopores.Yamamotoetal.[57]havereportedSi-basedallopticalswitchonthebasisofcircularpolarizationretention.TheobservationofballisticelectrontransportbyKoshidaandco-workers[58,59]hasledtothedevelopmentofasolid-statelightemittingdeviceinwhichorganicdyesareexcitedbyballisticelectronsproducedinpor-Si.DopingErandYbintopor-Sicanproduceawhitelightemitter[60].Byalteringthelayerstructureofpor-Sifilms,theiropticalbirefringencecanbetuned[61,62].Zenertunnellingoflighthasbeenobservedinopticalsuperlat-ticescomposedofpor-Si[63].

Theapplicationofpor-Sitosensortechnologyappearstobeparticularlypromising.Anammoniasensorbasedonpor-Si[]isnowcommerciallyavailable.Theversatil-ityofpor-Sibasedsensorsallowsforstructurestobemadethatcanexhibitlargeenhancementsinthesensitivitycom-paredto,forexample,conventionalsurfaceplasmonreso-nancedevices[*65].Ultrasonicelectronemissionenablesathree-dimensional(3D)imagesensor[66].Anumberofsensorapplicationshavebeenreportedinthepastyear:fororganicsolvents[67],anelectrical[68]orinterferomet-ric[69]sensorfordetectionofDNAhybridization,ahumiditysensorforrespirationmonitoring[70],aresis-tancebasedhydrogensensor[71],anopticalsensorforpes-ticidesinsolution[72],abiosensorforoligonucleotidesbasedoncapacitancemeasurements[73],aconductometricgassensorwithsub-ppmsensitivities[74],andachemilumi-nescencedetectorforbacteria[75].Anumberofdifferentapplicationsregardingbiosensorshavebeenreported[76–79].Bycombininglayerswithdifferentporesizes,adevicecanbemadethatbothseparatesbiomolecules,e.g.sucroseandbovineserumalbumin,andprovidesfordetectionviainterferometricmethods[*80].

Arecentadvanceinmatrixassistedlaserdesorption/ioni-zation(MALDI)istheuseofpor-Sisubstratesastheimmo-bilizationmatrix[81,82].ThisvariantofMALDIiscalleddesorption/ionizationonporoussiliconmassspectrometry(DIOS-MS)[83].AdenseforestofSinanowires[84],tips[85]orafilmwithacolumn/voidstructure[70]mayoffersomeadvantages,particularlywithapplicationtoproteomics.PorousSihasalsoappearedinanumberofenergyrelatedtechnologies.Poroussiliconhasbeenofgrowinginteresttosolartechnologybecauseofitspotentialtoincreasesolarcellefficiencythroughreducedreflectivityandrecombinationlosses,andexpandedspectralresponse[86].Aparticularlyinterestingdevelopmentinthisareaistheconstructionof3Dp–njunctionstructureforbetavol-taicsandphotovoltaicsbyFauchetandco-workers[**87].The3Dstructureexhibitsanorderofmagnitudeincrease

inefficiencycomparedtoaplanarstructure.Thegeometryofthese3Dporousdiodesshouldprovidesignificantenhancementintheperformanceofphotodetectorsandsolarcells.PorousSifilmshavebeeninvestigatedforanti-reflectioncoatings[88,].Anantireflectioncoatingofsil-iconnanowiresformedbymetal-assistedetchingexhibitsverylowreflectivitybutstillhasalowerefficiencythananuncoatedphotovoltaiccell,demonstratingthatprogressinimprovingcarrierlifetimesmuststillbemade[*90].MicroporesformedbychlorineplasmaetchingratherthanelectrochemistrycanalsobeusedtolowerthereflectivityofSisurfaces[91].Asacrificialpor-Silayerhasbeenusedtoimproveelectricalperformanceinsolarcellsbygetteringimpurities[92–95].CVDwasusedtodeposita20-lmthickc-Silayerontopofafree-standingpor-Sifilmtoproduceasolarcellwith9.6%efficiency[96].AnotheradvancehasbeenannouncedatIMEC[**97].Aburiedstackofalter-natinghigh(55%)andlow(22.5%)porositylayersisusedasaBraggreflectortoincreaseabsorptioninathinepitax-iallayerbyreflectinglightthathasbeentransmittedinafirstpassbackintotheepitaxiallayer.

Nanostructuredmaterialsareofgreatinterestforenergystorageandconversiondevices[98].PorousSihasbeeninvestigatedbyGoleandco-workers[*99]asanelectrodeforbatteries.TheproductionofminiaturefuelcellsusingaSisubstratepresentstheadvantagesofserialandparallelintegration.Micro-fuelcellshavebeenbuiltwithapor-Silayersupportinganelectrodeandprovidingchannelsforfuelflow[100],includingadirectethanolfuelcell[101],whichisdepictedinFig.1.PichonatandGauthier–Manuel[*102]havedevelopedaproton-conductingmembraneconsistingofpor-Siontowhichmoleculeswithacidgroupsaregrafted.Themembranescanbeoptimizednotonlybyadjustingthecharacteristicsofthepor-Sifilm(poresizeandstructure)butalsobychangingthenatureofthegraftedmolecules.Biologicalapplicationsofporoussiliconrelatenotonlytosensingbutalsotodrugdelivery,studiesofcell/surfaceinteractionsandbiomaterials.Por-Siisparticularlyinter-estinginabiologicalcontextbecauseitisbothbiocompat-ible[103]andbioresorbable[104,105].TheincorporationofSiintohydroxyapatitehasbeenstudiedinthecontextofdevelopingartificialbone[106]becauseitenhancesitsbiocompatibility.Sailor’sgroup[107]hasprobedhowthesurfacechemistryandporestructurecanbeoptimizedbothfortheuptakeandthereleaseofthesteroiddexametha-sone.Salonenandco-workershaveinvestigatedcarbonizedmesoporousSiparticlesfororaldosingofdrugs[108,109].Fonashandco-workers[70]haveshownpromotedattach-ment,differentiation,andproliferationofprokaryoticandeukaryoticcellsonpor-Siwithacolumn/voidstructureaswellaspreferentialadhesionofFL83Bhepatocytestopor-Sirelativetoborosilicateglass.3.Stainetching

RobinsandSchwartz[110–112]andTurner[*113]wereamongthefirsttostudysystematicallytheetchingofSiin

76K.W.Kolasinski/CurrentOpinioninSolidStateandMaterialsScience9(2005)73–83

Fuel Inlet AnodeMicro Capillaries (Fuel Channel) Contact (-) Contact (+) Platinum catalyst Nafion (PEM) Air Channels CathodeÓElsevier2004Fuel Chamber (Ethanol + Water) Fig.1.Cross-sectionalviewoftheporoussiliconbasedmicro-directethanolfuelcell(DEFC)stack.ThemacroporousSilayerprovideschannelsforcontactofairandfuelwiththeelectrodes.ReprintedwithpermissionfromS.Aravamudhan,A.R.A.Rahman,S.Bhansali,Sens.ActuatorsA2005,123–124,497.fluorideplusoxidantsolutions.RobinsandSchwartzcon-centratedontheelectropolishingregimeinwhichthesili-conisetchedisotropicallyleavingamoreorlesssmoothsurfaceandnoporousfilm.Turnerwasthefirsttostudystainetchinginwhichapor-Sifilmisproduced.Thisfol-lowedthediscoveryofpor-Siformationviaanelectro-chemicalroutebytheUhlirs[114].Sometimeelapsedbeforeitwasrealizedthatpor-Sifilmsproducedeitherelec-trochemically[16]orbystainetching[115,116]canproduceluminescentpor-Sifilmsaslongascrystallineorpolycrys-tallinesubstratesareused.VisibleluminescenceisnotobservedwhenamorphousSiisstainetched[117].

Turner[*113]proposedthatstainetchingisactuallyelectrochemicalinitsaction,thatis,thereareanodicandcathodicsitesonthesurfaceofthesemiconductorwithlocalcellcurrentsflowingbetweenthem.Thisassertionissupportedbystructuralstudies,suchasthoseofBealeetal.[118]andSchoisswohletal.[119],inwhichitwasreportedthatthestructureofanodicallyandstainetchedpor-Siissimilarand,therefore,theirformationmecha-nismsmustsharemuchincommon.Sigoesintosolutionattheanodicsiteswhiletheoxidantisreducedatthecatho-dicareas.Iftheetchingprocessisnon-preferentialandmaterialisremoveduniformly,anygivenareaonthesur-facecontinuallyalternatesbetweenbeinganodicandcathodic.Whenonespotisanodicmuchmorethanitiscathodicanetchpitwillform.Conversely,hillocksareformedonareasthatarecathodicmorethantheyareano-dic.Fromsuchanisotropy,poresdevelop.

Semiconductoretchingoccursbyoxidationofthesemi-conductorfollowedbyremovalofsurfaceatoms.However,oxidationisachemicallyambiguouswordandthishasledtosomemechanisticconfusion.Oftenetchingissaidtooccurbytheformationofanoxidefollowedbychemicaldissolutionoftheoxidelayer.ThisistrueofSietchingintheelectropolishingregime,(+0.7Vwithrespecttothenormalhydrogenelectrode[120]),whereanoxidegrows,itisremovedbyHF(aq)viachemicaletching[121–123]

andnopor-Siisformed.Butisthistrueinthepor-Sifor-mationregime?Alternatively,forpor-Sitoform,istherel-evantoxidationsteptheincreaseintheSioxidationstatetoamorepositivevaluewithouttheformationofanoxide?Itisnowknownthatpor-Siformationwhetherinitiatedelectrochemically,photoelectrochemicallyorbylaserirra-diation,isinitiatedbytheformationofvalencebandholesatthesiliconsurface.Anumberofmodelshavebeenpro-posedtoexplainetchingintheseregimesincludingthoseofKooijandVanmaekelburgh[*124];Gerischer,andcowork-´[127];LehmannandGoers[*125,126];KangandJorne¨sele

[*128];andKolasinski[*39].Turnerproposedthefollow-ingreactionsforetchantscomposedofHNO3,HFandH2O:

Anode:Siþ2H2Oþmhþ

!SiO2þ4Hþþð4ÀmÞeÀð1Þ

ð2ÞSiO2þ6HF!H2SiF6þ2H2O

Cathode:HNO3þ3Hþ

!NOþ2H2Oþ3hþð3ÞOverall:3Siþ4HNO3þ18HF

!3H2SiF6þ4NOþ8H2Oþ3ð4ÀmÞhþþ3ð4ÀmÞeÀ

ð4ÞThesearecompositereactionsratherthanelementarysteps.Whatisclearfromstudiestoelucidatetheelemen-tarystepsin(photo)electrochemicaletching[38,*125,129]isthatthefluoridespecieswhichcontrolthekineticsofetchingareHFandHFÀ2.

AsEq.(1)shows,holeproductioninthevalencebandisagainacrucialstepintheinitiationoftheetchingreaction.Here,nistheaveragenumberofholesrequiredtodissoci-ateoneSiatom.SinceTurner’stimethischemicalschemehasbeenacceptedalmostwithoutfurthercomment,eventhoughnoclearevidencehasbeenpresentedthatSiO2isformedasanintermediate[130]andonemustaskwhytheformationofpor-Sifromstainetchingissomuchdif-ferentfromthecommonmechanismthatdescribesanodic,

K.W.Kolasinski/CurrentOpinioninSolidStateandMaterialsScience9(2005)73–8377

photoelectrochemicalandlaser-assistedetchinginfluoridesolutions.InTurner’sreactionscheme,NOistheonlygasevolved.Ithasbeensuggested[131]thatNO+istheactivenitrogenspeciesorthatNOÀandrateofoxide2catalyzesthereaction[40].Theroleformationmustbecrucialtopor-Siformation.SiO2isetchedrapidlyandisotropicallybyacidicfluoridesolutions[132–134].IfauniformfilmofSiO2resultsfromtheinteractionoftheoxidantwiththesurface,thenthisfilmwillberemoveduniformlybytheactionofthefluoridecomponent.Electropolishingratherthanpor-Siformationensues.IfSiO2isformeddur-ingpor-Siformationitiscrucial,therefore,thattheSiO2beformedheterogeneouslyonthesurface,Ineffect,itmustonlyformatthebottomofpitssuchthatthesepitsdevelopintopores.Itsformationonsidewallsandhillocksmustsomehowbesuppressedtoavoidtheisotropicetchingofporesthatwouldleadtotheirremoval.IfSiO2formationisimportantinstainetching,thentheroleoftheoxidantistosomehowfacilitatetheformationofaninhomoge-neousoxidelayer.Onenecessaryconditionfortheforma-tionofthislayeristhattherateofoxidationmustnotexceedthecapacityofthefluoridesolutiontoetchtheoxide;otherwise,theoxidecoveragewillgrowuntilitcov-ersthesurfaceandisotropicetchingwillresult.

Itseemsunlikelythatasurfaceoxideplaysasignificantroleinpor-Siformationandthisideaisfurtherbolsteredbyexaminingetchinginalkalinesolutions[1].Etchingwithhydroxidedoesnotleadtopor-Siformation.PorousSiformsinafluoridesolutionbecausetheetchingreactionisself-limiting,whereasetchingwithOHÀisnotsimilarlyconstrained.ConsiderthemodelsofLehmannandGo¨sele[*128]andFrohnhoffetal.[135].Sietchinginacidicfluo-ridesolutionsisanelectrochemicalprocessandrespondstotheelectronicstructureoftheSi.QuantumconfinementeffectswidenthebandgapwhenSinanostructuresdropbelow$5nminsize[136].Thewallsoftheporesthembecomeeffectivelypassivatedbecausethereisadepletionofholeswithintheconfinedstructuresandholesarerequiredtoinitiatetheetchingsequence.Holesareinsteaddirectedtothebottomsofpores,whichareconnectedtounconfinedbulkSiandetchingproceedsthere.Hydroxidedoesnotexperienceasimilarquantumconfinementrelatedconstraintbecauseitcanetchviaachemicalpathway.Por-ousSiisnotstableinOHÀ(aq)andisquiteefficientlyremovedbyit.Intheabsenceofaself-limitingconstraintonoxideformationandsincethechemicaldissolutionofoxidebyHF(aq)isisotropic,thereisnodrivingforcetoinstigatetheformationofquantum-confinedstructuresastheresultofoxideformation.

Consequently,thewaytolookattheroleoftheoxidantistothinkofitpurelyasanelectrochemicaloxidantratherthanaproducerofsiliconoxides.ConsideringEq.(3)weseethatthecrucialroleoftheoxidantistoinjectholesintothevalenceband.Inthismannertheoxidant,ormorepre-ciselyitselectrochemicalpotential,takesontheroleofeitherthevoltageinelectrochemicaletchingorthephotonenergyinlaser-assistedetching.Therefore,crucialproper-

tiesoftheoxidantwillbeitselectrochemicalpotentialandtherateatwhichitcantransferchargewiththeSisur-face.Inordertoinjectholesintothevalenceband,anelec-tronacceptorleveloftheoxidantmustlieatorbelowthevalencebandmaximum(VBM),asshowninFig.2.Hence,theelectrochemicalpotentialoftheoxidantmustbesuffi-cientlypositive.Furthermore,byidentifyingtheroleoftheoxidantininitiatingetchingandtheimportanceofquantumconfinementtocreateself-limitingchargeinjec-tion,wecannowidentifytheelectrochemicalpotentialoftheoxidantasacontrolparameterthatcanbeusedtoinfluencepor-Siformation.

Kolasinski[*39]hasshownthattheholeisinjectedintoabulkbandandthatholeinjectiondirectlyintotheSi–Hbondisenergeticallyimpossibleundertheconditionsofmostelectrochemical,photoelectrochemical,laser-assistedetchingorstainetchingexperiments.ThusmodelsofstainetchinginvolvingholeinjectionintotheSi–Hbond[137]arenotfeasible.ThepresenceofavalencebandholechangestheeffectivestickingcoefficientofFÀ(aq)from65·10À11to$1.HoleinjectionistheswitchthatturnsonSietchingactivityinacidicfluoridesolutionswhereasOHÀistheinitiatorofreactivityinsolutionsnearandaboveneutralpH[*39].

NahidiandKolasinski[**138]haveusedanunder-standingofhowstainetchingisinitiatedtocontrolthephotoluminescencespectrumandbyimplicationthenano-crystallitesizedistribution.Theyusedoxidantswithdiffer-entelectrochemicalpotentialsE0(Fe(III),HNO3,MnO2À

foundthatthePLpeakwavelengthcorrelateswithE4)and0:amorepositivevalueofE0leadstobluerPLasshowninFig.3.

Furthermore,consistentwiththecontrollingroleoftheoxidantonthebasisofitsroleinholeinjectionintothevalencebandaccordingto(e.g.forFe(III)asoxidant)Cathode:Fe3þ!Fe2þþhþ

ð5Þ

Fig.2.HoleinjectioncanoccurviaanacceptorlevelsuchasA+,thatliesbelowtheVBMbutnotonesuchasB+thatliesaboveit.

78K.W.Kolasinski/CurrentOpinioninSolidStateandMaterialsScience9(2005)73–83

Fig.3.ThePLfromfilmsetchedwithFe3+(E0=0.47Vversusthestandardcalomelelectrode(SCE))peaksat696nm,comparedto654nmforHNO3(E0=0.66V)and604nmforMnOÀ4ðE0¼1:19VÞ.

theyhaveshown[**138]thatstainetchingcanproceedwithminimalbubbleformationandwithouttheneedtoin-vokesurfaceoxideformation.

Anode:Siþ6HFþhþ!H2SiF6þ4Hþþ3eÀ

ð6ÞOverall:SiþFe3þþ6HF!H2SiF6þFe2þþ4Hþþ3eÀ

ð7Þ

4.Metal-assistedetching

Dimova-Malinovskaetal.[139]demonstratedstainetchinginthepresenceofanevaporatedAllayercanpro-duceluminescentpor-Si.Kellyandco-workers[140,141]investigatedtheelectrochemistryofGalvaniccellforma-tionwhenanoblemetalisshortcircuitedtoSiinthepres-enceofanoxidantanddemonstratedthattheformationofmicroporousSiispossibleinaeratedHFandthatmacro-porousSicanbeproducedin5%HF+1%H2O2incom-binationwithpre-patterningofthesurfacewithinvertedpyramids.Metal-assistedelectrolessetchingtoformpor-SiwasdevelopedfurtherbyBohnandco-workers[*142–145]whosignificantlyimprovedtheprocessbyusingthinnerfilms.Au,PtorAu/Ptfilms(3nm6h620nm)weredepositedonaSisubstrate.EtchingwascarriedoutinanHF/H2O2/CH3OH(orCH3CH2OH)solution.DependingonthetypeofmetaldepositedandSidopingtypeanddopinglevel,por-Sifilmswithdifferentmorphol-ogiesandlight-emittingpropertieswereproducedonthetimescaleofsecondsinthedarkorunderambientlights,onbothp-andn-typeSi.

BypatterningthePtdeposit,theresultingporousfilmcanalsobepatterned.ChattopadhyayandBohn[145]haveusedaGa+focusedionbeamtodissociateanorganometal-licprecursoranddepositPtinsquareswith1.25–20lmedges.ThesquaresarecomposedofamixtureofC,Si,O,PtandGa.Etchingoccursunderandclosetothedepos-itsandresultsinahighlynon-uniformfilm.Alternatively[143],theSisubstratecanbecoveredwithanoctadecyltri-chlorosilane(OTS)monolayerpatternedusingmicro-con-tactprinting.PtisdepositedinareasnotcoveredwithOTSandpor-Sithatluminescencearound580nmuponUVilluminationisformedinthePt-coatedregions.

ThinmetalcoatingsfacilitatetheetchinginHFandH2O2,andofthemetalsinvestigated,Ptyieldsthefastestetchratesandproducespor-SiwiththemostintensePL.Gasevolutionfromthemetal-coatedareawasclearlyobserved,especiallyforPtandAu/Pd.Forthesemetalsnometaldissolutionwasobserved,incontrasttothebehaviourusingAl.Lietal.[*142]proposedareactionschemeinvolvinglocalcouplingofredoxreactionswiththemetaltoexplainthemetal-assistedetchingprocess.

Cathode:H2O2þ2Hþ!2H2Oþ2hþ

ð8Þ2Hþ2eÀ!2H2\"

ð9ÞReaction:Siþ4hþþ4HF!SiF4þ4Hþ

ð10Þ

SiF4þ2HF!H2SiF6ð11ÞOverall:SiþH2O2þ6HF!2H2OþH2SiF6þH2\"ð12ÞHoleinjectioninthiscaseisprovidedbythereactionofH2O2onthemetalparticle.TheholesareinjectedintotheSivalencebandandthendiffuseawayfromthemetalparticleexplainingwhyetchingisconfinedtothenear-par-ticlearea.DissolvedO2canalsoplaytheroleofoxidantbutleadstoetchingataverylowrate[146].

Gorostizaandco-workers[147–*149]havestudiedthedepositionofPtandNiinfluoridesolutionsontoSiwithregardtochargeexchangeandpor-Siformation.Intheabsenceofmetalions,theFermilevelofn-andp-typeSiliesclosetoE0(H+/H2)attheopencircuitpotential(OCP)asdepictedinFig.4.Thissteady-stateequilibriumcanbedescribedasadynamicequilibriumbetweentwooppositereactions:theanodiconebeingthedissolutionofthesubstrateandtheotherbeingthereductionofpro-

3002yteicoSlacimehCnaciremAÓFig.4.ExperimentalenergydiagramoftheinterfacebetweenSiandablankfluoridesolution(---)atpH2andfluoridesolution(—)inthepresenceof1mMPt2+/Pt.ReprintedwithpermissionfromP.Gorostiza,P.Allongue,R.Diaz,J.R.Morante,F.Sanz,J.Phys.Chem.B2003,107,54.

K.W.Kolasinski/CurrentOpinioninSolidStateandMaterialsScience9(2005)73–8379

tons(H2evolution)anddissolvedoxygen.Luminescentpor-SiisformedduringPtdeposition.Nobubblesareformedduringpor-Siformation.TheyinferthattheH2formedfromtheetchproducts’reactionwithwaterisreox-idizedtoprotons.TheelectronsproducedhaveenergiesclosetotheFermilevelofPtclusters.Theymayeitherbere-emittedfromthePtclustersintotheSiorrecombinewithholes.Thelatterprocessismorelikely,withtheinter-facestatesatthePt/Sicontactsactingasrecombinationcentres.NidepositsautocatalyticallyonSifromfluoridesolutionsofpH8,becausetheNi/Ni2+levellieswithintheSibandgap.DepositionisaccompaniedbyvisibleH2evolutionandnopor-Siformation.NoNidepositionorhydrogenevolutionisobservedatlowpH.

Anumberofstudieshaveappearedinthepastyearinvolvingelectrolessmetal-particle-assistedetching[150,151].Pengandco-workers(seeFig.5)haveusedetch-inginHF/AgNO3solutionstoformfilmscomposedofalignedSinanowires(SiNW)[*90,152–**155].Etchingdis-playslittlecrystallographicdependenceandcanbeper-formedoncrystallineorpolycrystallinesubstrates.Etchingfor20minat50°Ccreatesafilmapproximately10lmthick.AfteretchingAgparticlesremaininthefilm.Thefilmsexhibitverylowreflectivity,whichmakesthemattractiveforsolarcellapplications[*90].Agnanoparticlesdepositoutofsolutionontothesurfaceofthesubstrate.Theycatalyzetheetchingreaction,sinkbelowthesurfaceandleavebehindcolumnsofSinanostructures.IfonlyAgNO3isused,thenAgdendriteformationaccompaniesSiNWformation.ThesecanbeavoidedbythereplacingAgNO3afterashortperiodwithFe(NO3)3.

HF/H2O2mixtureshavebeenusedbyTsujinoandMat-sumura[156,157]toetchcylindricalandhelicalporesinc-Si.Ag,Pt,PdorCuparticlesaredepositedbyelectrolessplatingandthenexposedtothesolution.Thetopofthewaferiscoveredbyanupto3lmthickmicroporouslayer

4002HCV-yeliWÓFig.5.Across-sectionalelectronmicrographofapor-SifilmcomposedofverticalSinanowires.Thefilmwascreatedbyetchingina4.6moldmÀ3HF+0.02moldmÀ3AgNO3solutionfor60minat50°C.ReprintedwithpermissionfromK.Q.Peng,Z.P.Huang,J.Zhu,Adv.Mater.2004,16,73.

whenetchedina10:1(v:v)solutionof10%HFand30%H2O2andwithPtasthedepositedmetal.Thislayerexhib-itsvisiblePL.Themicroporouslayerisonly300nmthickwhenAgisused.WhatmoststrikinglydifferentiatesAgfromotherPdandCuisthatstraightmacroporesonSi(100)orinclinedmacroporesonSi(111)existbelowthemicroporousregion.SometimesforPt,cylindricalorheli-calporesarefoundbelowthemicroporousregion.ThehelicalmacroporesarealsosometimesobservedforAg.Switchingfromcylindricaltohelicalporesisaccomplishedbychangingthesolutionconcentrationsandthewallsofthemacroporesarelinedwithmicroporoussilicon.Agpar-ticlesarefoundatthebottomsofthesemacropores,withadiametermatchingthatofthepore.Iftheetchingtimeisextendedto10h,poresasdeepas500lmand$50nmindiameterarefound.

Cruzetal.[158]havestudiesHF/H2O2/CH3CH2OHetchingwithAuorPtparticlesandfoundthattheetchdepthandfilmmorphologyrespondtodopinglevelbutnotdopingtype.Themetalfilms(1nm6h68nm)weredepositedbyvacuumsputtering.Poremorphologyalsodependsonthemetal.AuisfoundtoformamorecolumnarstructureatahigherrateasopposedtoaspongystructureforPt.Theydidobservetheformationofsomestraightmacroporesbutalwaysinthepresenceofinterconnectinglateralpores.Etchdepthwasproportionaltoetchtimeupto3hatwhichpointitstopped.Increasedtemperature(40°Cversusroomtemperature)increasestheetchrate.5.Chemicalvapouretching

Aninterestingbutnotwellunderstoodvariationonstainetchingisthatofchemicalvapouretching(CVE)[159–163].InCVEasolutionismadeupfromconcentratedHFplusconcentratedHNO3.However,insteadofdippingtheSisubstrateinthesolution,thesubstrateisheldabovethesolutionandthetemperaturesofthesolution,thesub-strateandthetimeofexposurearecontrolled.Dependingontheseparameters,eitherapor-Silayeroralayercom-posedprimarilyof(NH4)2SiF6withathinpor-Sitransitionlayerisformed.Bothlayersarephotoluminescent.Kokeretal.[1]havedemonstratedthattheluminescenceasso-ciatedwithahexafluorosilicate/por-Siinterfaceisblue-shiftedcomparedtothePLfromthepurepor-Silayer.AsimilartrendwasfoundbySaadounetal.[162].Asammo-niumhexafluorosilicateiswatersolubleandpor-Siissolu-bleinalkalinesolutions,CVEcanbeusedtoformgroovesinSi,whichisofinterestfortheuseofpor-Siinsolarcelltechnology[94,95,159,160].

Themechanismofetchinginthisregimeisnotwellunderstood.Infraredspectroscopyrevealsacombinationofhydrogenterminationandoxidationofthesurface[159,161,162].Whentoomuchcondensationoccursanddropletsformonthesurface,por-Siformationissup-pressed[163].Capillarycondensationintheporesmaybeoccurringbeforedropletsareobservedontheexternalsur-face.IfEq.(2)weretheonlywaytoremoveSifromthe

80K.W.Kolasinski/CurrentOpinioninSolidStateandMaterialsScience9(2005)73–83

surface,thentherewouldbenowaytoetchSiintheabsenceofhexafluorosilicateformation.However,theini-tialetchproduct[1,*39]isavolatilecompoundsuchasHSiF3andthisprimaryproducthydrolyzestothehexaflu-orosilicate.Ifthehydrolysisreactionisslow,thevolatileprimaryetchproductcanbelosttothegasphasebeforeformingaproductthatcanprecipitateonthesurface.6.Conclusionsandperspectives

Overthelasttwoyearstherehasbeenanexplosionintheapplicationsofporoussilicontoavarietyoftechnolog-icalareasincludingsensors,energy,biomedicaltechnology,optoelectronicsandanalyticalchemistry.Progressintheseareasappearstobeaccelerating.Anodicetchingofsiliconremainsthemostintensivelystudiedandmostcontrollablesyntheticmethodforpor-Siproduction,particularlyinthatitcanbeusedtoproducemultilayerstacksofdifferentporosityorcombinedwithlithographicpositioningofporenucleationtocreatemacroporoussilicon.Nonetheless,electrolessetchingbecauseofitssimplicityandabilitytoetcharbitrarilyshapedobjectssuchasSipillars[165,166]offerssomeadvantages.Thereisstillmuchtolearnaboutthemechanismsinvolvedinelectrolessetching,particularlyformetal-assistedetching.Canmorphologicalcontrolbefurtherenhanced?Thefilmsproducedbymetal-assistedetchingpresentamuchdifferentstructurethanconven-tionalpor-Si.Someofthestainetchedfilmsshowevidenceforsuperstructuresimposedoncombinationsofmicro-andmacroporoussilicon.Greatermechanisticunderstandinginthefutureshouldleadtogreatercontroloverthestructureandpropertiesofthefilmsproduced.Acknowledgements

ItiswithpleasurethatIacknowledgeacriticalreadingofthismanuscriptbyJosephMaurerandGiovanniZangari.IalsothankShyamAravamudhanandShekharBhansaliforprovidingFig.1,FaustoSanzforprovidingFig.4,andKuiqingPengandJingZhuforprovidingFig.5.ThisworkwassupportedbytheUniversityofVirginiaandtheNationalScienceFoundationIGERTProgramunderGrant#9972790.References

Thepapersofparticularinteresthavebeenhighlightedas:

*ofspecialinterest;

**ofveryspecialinterest.

[1]KolasinskiKW.Growthandetchingofsemiconductors.In:

HasselbrinkS,LundqvistI,editors.Handbookofsurfacescience,vol.3.Amsterdam:Elsevier;inpress.

[2]MooneyPM.StrainrelaxationanddislocationsinSiGe/Si

structures.MaterSciEng,R1996;17:105.

[3]PaulDJ.Si/SiGeheterostructures:frommaterialandphysicsto

devicesandcircuits.SemicondSciTechnol2004;19:R75.

[4]RoseiF.Nanostructuredsurfaces:challengesandfrontiersin

nanotechnology.JPhys:CondMatter2004;16:S1373.

[5]NishinagaT.Atomisticaspectsofmolecularbeamepitaxy.Prog

CrystGrowthCharactMater2004;48/49:104.

[6]FranchiS,TrevisiG,SeravalliL,FrigeriP.Quantumdot

nanostructuresandmolecularbeamepitaxy.ProgCrystGrowthCharacterizationMater2003;47:166.

[7]JoyceBA,VvedenskyDD.Self-organizedgrowthonGaAs

surfaces.MaterSciEng,R2004;46:127.

[8]HoweP,AbbeyB,LeRuEC,MurrayR,JonesTS.Strain-interactionsbetweenInAs/GaAsquantumdotlayers.ThinSolidFilms2004;4–465:225.

[9]LeRuEC,HoweP,JonesTS,MurrayR.Strain-engineeredInAs/

GaAsquantumdotsforlong-wavelengthemission.PhysRevB2003;67:165303.

[10]XieQ,MadhukarA,ChenP,KobayashiNP.Verticallyself-organizedInAsquantumboxislandsonGaAs(100).PhysRevLett1995;75:2542.

[11]MiZ,BhattacharyaP.Molecular-beamepitaxialgrowthand

characteristicsofhighlyuniformInAs/GaAsquantumdotlayers.JApplPhys2005;98:023510.

[12]PriesterC,LannooM.Growthaspectsofquantumdots.Curr

OpinSolidStateMaterSci1997;2:716.

[13]ChenMS,GoodmanDW.Thestructureofcatalyticallyactive

goldontitania.Science2004;306:252.

[14]WilcoxonJP,SamaraGA.Tailorable,visiblelightemissionfrom

siliconnanocrystals.ApplPhysLett1999;74:31.

[15]AkcakirO,TherrienJ,BelomoinG,BarryN,MullerJD,Gratton

E,etal.Detectionofluminescentsingleultrasmallsiliconnanoparticlesusingfluctuationcorrelationspectroscopy.ApplPhysLett2000;76:1857.

[16]CanhamLT.Siliconquantumwirearrayfabricationbyelectro-chemicalandchemicaldissolutionofwafers.ApplPhysLett1990;57:1046.

[17]CullisAG,CanhamLT,CalcottPDJ.Thestructuralandlumi-nescencepropertiesofporoussilicon.JApplPhys1997;82:909.[18]KolasinskiKW.Laser-assistedrestructuringofsiliconovernano-,

meso-andmacro-scales.In:PandalaiSG,editor.Recentresearchadvancesinappliedphysics,vol.7.Kerala,India:TransworldResearchNetwork;2004.p.267.[19]Fo¨llH,ChristophersenM,CarstensenJ,HasseG.Formationand

applicationofporoussilicon.MaterSciEng,R2002;39:93.

[20]LehmannV.Electrochemistryofsilicon:instrumentation,science,

materialsandapplications.Weinheim:Wiley-VCH;2002.

[21]ZhangXG.Morphologyandformationmechanismsofporous

silicon.JElectrochemSoc2004;151:C69.

[22]CanhamL.Propertiesofporoussilicon.London:Institutionof

ElectricalEngineers;1997.

[23]KoshidaN,MatsumotoN.Fabricationandquantumproperties

ofnanostructuredsilicon.MaterSciEng,R2003;40:169.

[24]SailorMJ,LeeEJ.Surfacechemistryofluminescentsilicon

nanocrystallites.AdvMater1997;9:783.

[25]BisiO,OssiciniS,PavesiL.Poroussilicon:Aquantumsponge

structureforsiliconbasedoptoelectronics.SurfSciRep2000;38:1.[26]LockwoodDJ.Opticalpropertiesofporoussilicon.SolidState

Commun1994;92:101.

[27]JohnGC,SinghVA.Poroussilicon:theoreticalstudies.PhysRep

1995;263:93.

[28]KanemitsuY.Lightemissionfromporoussiliconandrelated

materials.PhysRep1995;263:1.

[29]FauchetPM.Photoluminescenceandelectroluminescencefrom

poroussilicon.JLumin1996;70:294.[30]MatthiasS,Mu¨llerF,SchillingJ,Go

¨seleU.Pushingthelimitsofmacroporoussiliconetching.ApplPhysA2005;80:1391.

[31]BurrowsVA,ChabalYJ,HigashiGS,RaghavachariK,Christ-manSB.InfraredspectroscopyofSi(111)surfacesafterHFtreatment:hydrogenterminationandsurfacemorphology.ApplPhysLett1988;53:998.

K.W.Kolasinski/CurrentOpinioninSolidStateandMaterialsScience9(2005)73–83

81

[32]ChabalYJ,HigashiGS,RaghavachariK,BurrowsVA.Infrared

spectroscopyofSi(111)andSi(100)surfaceafterHFtreatment:Hydrogenterminationandsurfacemorphology.JVacSciTechnol,A19;7:2104.

[33]HigashiGS,ChabalYJ,TrucksGW,RaghavachariK.Ideal

hydrogenterminationoftheSi(111)surface.ApplPhysLett1990;56:656.

[34]TrucksGW,RaghavachariK,HigashiGS,ChabalYJ.Mecha-nismofHFetchingofsiliconsurfaces:atheoreticalunderstandingofhydrogenpassivation.PhysRevLett1990;65:504.

[35]TrucksGW,RaghavachariK,HigashiGS,ChabalYJ.Trucks

etal.reply.PhysRevLett1991;66:18.

[36]JakobP,ChabalYJ,RaghavachariK,BeckerRS,BeckerAJ.

KineticmodelofthechemicaletchingofSi(111)surfacesbybufferedHFsolutions.SurfSci1992;275:407.

[37]ChabalYJ,HarrisAL,RaghavachariK,TullyJC.Infrared

spectroscopyofH-terminatedsiliconsurfaces.IntJModPhysB1993;7:1031.

[38]KokerL,KolasinskiKW.Investigationsofthephotoelectro-chemicaletchingofSiandporousSiinaqueousHF.PhysChemChemPhys2000;2:277.

[*39]KolasinskiKW.ThemechanismofSietchinginfluoride

solutions.PhysChemChemPhys2003;5:1270.

[40]JonesLA,TaylorGM,WeiF-X,ThomasDF.Chemicaletching

ofsilicon:Smooth,roughandglowingsurfaces.ProgSurfSci1995;50:283.

[41]PhysStatSolA2005;202:1347–718.

[42]LockwoodDJ,PavesiL.Siliconfundamentalsforphotonics

applications.In:LockwoodDJ,PavesiL,editors.Siliconphotonics,vol.94.Berlin:Springer-Verlag;2004.p.1–50.[43]Opt.Mater.2005;27:731–1109.

[44]ZhaoX,WeiCM,YangL,ChouMY.Quantumconfinementand

electronicpropertiesofsiliconnanowires.PhysRevLett2004;92:236805.

[45]SundholmD.Densityfunctionalstudiesoftheluminescenceof

Si29H36.PhysChemChemPhys2004;6:2044.

[46]LehtonenO,SundholmD.Density-functionalstudiesofexcited

stateofsiliconnanoclusters.PhysRevB2005;72:085424.

[47]WeissSM,HaurylauM,FauchetPM.Tunablephotonicband-gapstructuresforopticalinterconnects.OptMater2005;27:740.[48]WeissSM,OuyangHM,ZhangJD,FauchetPM.Electrical

andthermalmodulationofsiliconphotonicbandgapmicro-cavitiescontainingliquidcrystals.OptExpress2005;13:1090.[49]JuhaszR,Elfstro¨mN,LinnrosJ.Controlledfabricationofsilicon

nanowiresbyelectronbeamlithographyandelectrochemicalsizereduction.NanoLett2005;5:275.

[50]KleimannP,BadelX,LinnrosJ.Towardtheformationofthree-dimensionalnanostructuresbyelectrochemicaletchingofsilicon.ApplPhysLett2005;86:183108.

[**51]SychugovI,JuhaszR,ValentaJ,LinnrosJ.Narrowlumines-cencelinewidthofasiliconquantumdot.PhysRevLett2005;94:087405.

[52]CazzanelliM,KovalevD,DalNegroL,GaburroZ,PavesiL.

Polarizedopticalgainandpolarization-narrowingofheavilyoxidizedporoussilicon.PhysRevLett2004;93:207402.

[53]FauchetPM,RuanJ,ChenH,PavesiL,DalNegroL,Cazzaneli

M,etal.Opticalgainindifferentsiliconnanocrystalsystems.OptMater2005;27:745.

[54]RuanJ,FauchetPM,DalNegroL,CazzanelliM,PavesiL.

Stimulatedemissioninnanocrystallinesiliconsuperlattices.ApplPhysLett2003;83:5479.

[55]LuterovaK,CazzanelliM,LikformanJP,NavarroD,ValentaJ,

OstatnickyT,etal.Opticalgaininnanocrystallinesilicon:comparisonofplanarwaveguidegeometrywithanon-waveguid-ingensembleofnanocrystals.OptMater2005;27:750.

[*56]CloutierSG,KossyrevPA,XuJ.Opticalgainandstimulated

emissioninperiodicnanopatternedcrystallinesilicon.NatureMater2005;4:887–91.

[57]YamamotoN,MatsunoT,TakaiH,OhtaniN.Circular

polarizationcontrolinsilicon-basedall-opticalswitch.JpnJApplPhys2005;44:4749.

[58]KojimaA,KoshidaN.Ballistictransportmodedetectedby

picosecondtime-of-flightmeasurementsfornanocrystallinepor-oussiliconlayer.ApplPhysLett2005:86.

[59]NakajimaY,UchidaT,ToyamaH,KojimaA,GellozB,Koshida

N.Asolid-statemulticolorlight-emittingdevicebasedonballisticelectronexcitation.JpnJApplPhys,Part12004;43:2076.

[60]LuoL,ZhangXX,LiKF,CheahKW,ShiHX,WongWK,etal.

Formbirefringenceofanisotropicallynanostructuredsilicon.AdvMater2004;16:16.

[61]KunznerN,DienerJ,GrossE,KovalevD,TimoshenkoVY,Fujii

M.Formbirefringenceofanisotropicallynanostructuredsilicon.PhysRevB2005:71.

[62]DienerJ,KunznerN,GrossE,KovalevD,FujiiM.Siliconbased

opticaldevices–photonicapplicationsofanisotropicallynano-structuredsilicon.PhysStatusSolidiA2005;202:1432.

[63]GhulinyanM,OtonCJ,GaburroZ,PavesiL,ToninelliC,

WiersmaDS.Zenertunnelingoflightwavesinanopticalsuperlattice.PhysRevLett2005:94.

[]AppliedNanotech,Inc.(subsidiaryofNano-Proprietary,Inc.).

Availablefromhttp://www.nano-proprietary.com/index.htm?ani.htm.

[*65]SaarinenJJ,WeissSM,FauchetPM,SipeJE.Opticalsensor

basedonresonantporoussiliconstructures.OptExpress2005;13:3754.

[66]TsubakiK,YamanakaH,KitadaK,KomodaT,KoshidaN.

Three-dimensionalimagesensinginairbythermallyinducedultrasonicemitterbasedonnanocrystallineporoussilicon.JpnJApplPhys,Part12005;44:4436.

[67]ArcherM,ChristophersenM,FauchetPM.Electricalporous

siliconchemicalsensorfordetectionoforganicsolvents.SensActuatorsB2005;106:347.

[68]ArcherM,ChristophersenM,FauchetPM.Macroporoussilicon

electricalsensorforDNAhybridizationdetection.BiomedMicrodevices2004;6:203.

[69]SteinemC,JanshoffA,LinVS-Y,Vo¨lckerNH,GhadiriMR.

DNAhybridization-enhancedporoussiliconcorrosion:mecha-nisticinvestigationsandprospectforopticalinterferometricbiosensing.Tetrahedron2004;60:11259.

[70]KalkanAK,HenryMR,LiH,CuiffiJD,HayesDJ,PalmerC,

etal.Biomedical/analyticalapplicationsofdepositednanostruc-turedSifilms.Nanotechnology2005;16:1383.

[71]LuongoK,SineA,BhansaliS.Devolopmentofahighlysensitive

porousSi-basedhydrogensensorusingPdnano-structures.SensActuatorsB2005;111–112:125.

[72]DeStefanoL,MorettiL,RendinaI,RotirotiL.Pesticides

detectioninwaterandhumicsolutionsusingporoussilicontechnology.SensActuatorsB2005;111–112:522.

[73]LillisB,JungkC,IacopinoD,WheltonA,HurleyE,Sheehan

MM,etal.Microporoussiliconandbiosensordevelopment:structuralanalysis,electricalcharacterisationandbiocapacityevaluation.BiosensBioelectron2005;21:282.

[74]LewisSE,DeBoerJR,GoleJL,HeskethPJ.Sensitive,selective,

andanalyticalimprovementstoaporoussilicongassensor.SensActuatorsB2005;110:54.

[75]MathewFP,AlociljaEC.Poroussilicon-basedbiosensorfor

pathogendetection.BiosensBioelectron2005;20:1656.

[76]DeLouiseLA,FauchetPM,MillerBL,PentlandAA.Hydrogel-supportedoptical-microcavitysensors.AdvMater2005;17:2199.

[77]DeLouiseLA,KouPM,MillerBL.Cross-correlationofoptical

microcavitybiosensorresponsewithimmobilizedenzymeactivity.Insightsintobiosensorsensitivity.AnalChem2005;77:3222.[78]DeLouiseLA,MillerBL.Enzymeimmobilizationinporous

silicon:quantitativeanalysisofthekineticparametersforgluta-thione-S-transferases.AnalChem2005;77:1950.

82K.W.Kolasinski/CurrentOpinioninSolidStateandMaterialsScience9(2005)73–83

[79]DeLouiseLA,MillerBL.Quantitativeassessmentofenzyme

immobilizationcapacityinporoussilicon.AnalChem2004;76:6915.

[*80]PacholskiC,SartorM,SailorMJ,CuninF,MiskellyGM.

Biosensingusingporoussilicondouble-layerinterferometers:reflectiveinterferometricFouriertransformspectroscopy.JAmChemSoc2005;127:11636.

[81]AfonsoC,BudimirN,FournierF,TabetJC.Activatedsurfaces

forlaserdesorptionmassspectrometry:applicationforpeptideandproteinanalysis.CurrPharmDesign2005;11:2559.

[82]PihlainenK,GrigorasK,FranssilaS,KetolaR,KotiahoT,

KostiainenR.Analysisofamphetaminesandfentanylsbyatmosphericpressuredesorption/ionizationonsiliconmassspec-trometryandmatrix-assistedlaserdesorption/ionizationmassspectrometryanditsapplicationtoforensicanalysisofdrugseizures.JMassSpectrom2005;40:539.

[83]LiQ,RicardoA,BennerSA,WinefordnerJD,PowellDH.

Desorption/ionizationonporoussiliconmassspectrometrystud-iesonpentose-boratecomplexes.AnalChem2005;77:4503.

[84]GoEP,AponJV,LuoG,SaghatelianA,DanielsRH,SahiV,

etal.Desorption/ionizationonsiliconnanowires.AnalChem2005;77:11.

[85]Gorecka-DrzazgaA,DziubanJ,DrzazgaW,KrajA,SilberringJ.

Desorption/ionizationmassspectrometryonarrayofsiliconmicrotips.JVacSciTechnolB2005;23:819.

[86]YerokhovVY,MelnykII.Poroussiliconinsolarcellstructures:a

reviewofachievementsandmoderndirectionsoffurtheruse.RenewSustainableEnergyRev1999;3:291.

[**87]SunW,KheraniNP,HirschmanKD,GadekenLL,FauchetPM.

Athree-dimensionalporoussiliconp–ndiodeforbetavoltaicsandphotovoltaics.AdvMater2005;17:1230.

[88]StriemerCC,FauchetPM.Dynamicetchingofsiliconforsolar

cellapplications.PhysStatusSolidiA2003;197:502.

[]AouidaS,SaadounM,BoujmilMF,BenRabhaM,Bessaı¨sB.

EffectofUVirradiationsonthestructuralandopticalfeaturesofporoussilicon:applicationinsiliconsolarcells.ApplSurfSci2004;238:193.

[*90]PengK,XuY,WuY,YanY,LeeS-T,ZhuJ.Alignedsingle-crystalSinanowirearraysforphotovoltaicapplications.Small2005;1:1062.

[91]TianL,BhargavaRamK,AhmadI,MenonL,HoltzM.Optical

propertiesofananoporousarrayinsilicon.JApplPhys2005;97:026101.

[92]HassenM,BenJaballahA,HajjiM,KhedherN,Bessaı¨sB,

EzzaouiaH,etal.Performanceimprovementsofcrystallinesiliconbyiterativegetteringprocessforshortdurationandwiththeuseofporoussiliconassacrificiallayer.SolEnergyMater2005;87:493.

[93]KhedherN,HajjiM,HassenM,BenJaballahA,OuertaniB,

EzzaouiaH,etal.Getteringimpuritiesfromcrystallinesiliconbyphosphorusdiffusionusingaporoussiliconlayer.SolEnergyMater2005;87:605.

[94]HajjiM,BenJaballahA,HassenM,KhedherN,RahmouniH,

Bessaı¨sB,etal.Silicongettering:somenovelstrategiesforperformanceimprovementsofsiliconsolarcells.JMaterSci2005;40:1419.

[95]KhedherN,BenJaballahA,HassenM,HajjiM,EzzaouiaH,

Bessaı¨sB,etal.Getteringbyheatthermalprocessing:applicationincrystallinesiliconsolarcells.MaterSciSemicondProcess2004;7:439.

[96]SolankiCS,CarnelL,VanNieuwenhuysenK,UlyashinA,

PosthumaN,BeaucarneG,etal.Thin-filmfree-standingmono-crystallineSisolarcellswithheterojunctionemitter.ProgPhoto-voltaics2005;13:201.

[**97]DuerinckxF.,VanNieuwenhuysenK,KimHJ,Kuzma-FilipekI,

BeaucarneG,PoortmansJ.Lighttrappingforepitaxialthinfilmcrystallinesiliconsolarcells.In:Proc20thEuroPhotovoltaicSolarEnergyConf,2005.p.1190.

[98]Arico

`AS,BruceP,ScrosatiB,TarasconJM,VanSchalkwijkW.Nanostructuredmaterialsforadvancedenergyconversionandstoragedevices.NatureMater2005;4:366.

[*99]ShinHC,CornoJA,GoleJL,LiuML.Poroussiliconnegative

electrodesforrechargeablelithiumbatteries.JPowerSources2005;139:314.

[100]YamazakiY.ApplicationofMEMStechnologytomicrofuel

cells.ElectrochimActa2005;50:663.

[101]AravamudhanS,RahmanARA,BhansaliS.Poroussiliconbased

orientationindependent,self-primingmicrodirectethanolfuelcell.SensActuatorsA2005;123–124:497.

[*102]PichonatT,Gauthier-ManuelB.Developmentofporoussilicon-basedminiaturefuelcells.JMicromechMicroeng2005;15:S179.

[103]ForakerAB,WalczakRJ,CohenMH,BoiarskiTA,GroveCF,

SwaanPW.Biocompatiblepor-Si.PharmRes2003;20:110.

[104]CanhamLT.Bioactivesiliconstructurefabricationthrough

nanoetchingtechniques.AdvMater1995;7:1033.

[105]CanhamLT.Derivatizedmesoporoussiliconwithdramatically

improvedstabilityinsimulatedhumanbloodplasma.AdvMater1999;11:1505.

[106]KimYH,SongH,RiuDH,KimSR,KimHJ,MoonJH.

PreparationofporousSi-incorporatedhydroxyapatite.CurrApplPhy2005;5:538.

[107]AnglinEJ,SchwartzMP,NgVP,PerelmanLA,SailorMJ.

EngineeringthechemistryandnanostructureofporoussiliconFabry-Perotfilmsforloadingandreleaseofasteroid.Langmuir2004;20:112.

[108]SalonenJ,PaskiJ,Vaha-HeikkilaK,HeikkilaT,BjorkqvistM,

LehtoVP.Determinationofdrugloadinporoussiliconmicro-particlesbycalorimetry.PhysStatusSolidiA2005;202:1629.[109]LehtoVP,Vaha-HeikkilaK,PaskiJ,SalonenJ.Useof

thermoanalyticalmethodsinquantificationofdrugloadinmesoporoussiliconmicroparticles.JThermalAnalCalorimetry2005;80:393.

[110]RobbinsH,SchwartzB.Chemicaletchingofsilicon.I.Thesystem

HF,HNO3,andH2O.JElectrochemSoc1959;106:505.

[111]RobbinsH,SchwartzB.Chemicaletchingofsilicon.II.The

systemHF,HNO3,H2OandHC2H3O2.JElectrochemSoc1960;107:108.

[112]RobbinsH,SchwartzB.ChemicalEtchingofSilicon.III.Atem-peraturestudyintheacidsystem.JElectrochemSoc1961;108:365.

[*113]TurnerDR.Onthemechanismofchemicallyetchinggermanium

andsilicon.JElectrochemSoc1960;107:810.[114]UhlirA.BellSystTechJ1956;35:333.

[115]SarathyJ,ShihS,JungK,TsaiC,LiK-H,KwongD-L,etal.

Demonstrationofphotoluminescenceinnonanodizedsilicon.ApplPhysLett1992;60:1532.

[116]FathauerRW,GeorgeT,KsendzovA,VasquezRP.Visible

luminescencefromsiliconwaferssubjectedtostainetches.ApplPhysLett1992;60:995.

[117]StecklAJ,XuJ,MogulHC.Crystallinityandphotoluminescence

instain-etchedporousSi.JElectrochemSoc1994;141:674.

[118]BealeMIJ,BenjaminJD,UrenMU,ChewNG,CullisAG.The

formationofporoussiliconbychemicalstainetches.JCrystGrowth1986;75:408.

[119]SchoisswohlM,CantinJL,vonBardelebenHJ,AmatoG.

Electronparamagneticresonancestudyofluminescentstainetchedporoussilicon.ApplPhysLett1995;66:3660.

[120]RappichJ,LewerenzHJ.Photo-andpotential-controllednano-poroussiliconformationonn-Si(111):AninsituFTIRinvesti-gation.ThinSolidFilms1996;276:25.[121]GerischerH,Lu¨bkeM.Electrolyticgrowthanddissolutionof

oxidelayersonsiliconinaqueoussolutionsoffluorides.BerBunsen-GesPhysChem1988;92:573.

[122]PeinerE,SchlachetzkiA.Anodicdissolutionduringelectrochem-icalcarrier-concentrationprofilingofsilicon.JElectrochemSoc1992;139:552.

K.W.Kolasinski/CurrentOpinioninSolidStateandMaterialsScience9(2005)73–83

83

[123]SmithRL,CollinsSD.Poroussiliconformationmechanisms.J

ApplPhys1992;71:R1.

[*124]KooijES,VanmaekelberghD.Catalysisandporeinitiationinthe

anodicdissolutionofsiliconinHF.JElectrochemSoc1997;144:1296.

[*125]GerischerH,AllongueP,CostaKielingV.Themechanismofthe

anodicoxidationofsiliconinacidicfluoridesolutionsrevisited.BerBunsen-GesPhysChem1993;97:753.

[126]AllongueP,KielingV,GerischerH.Etchingmechanismand

atomicstructureofH–Si(111)surfacespreparedinNH4F.ElectrochimActa1995;40:1353.

[127]KangY,Jorne

´J.Photoelectrochemicaldissolutionofn-typesilicon.ElectrochimActa1998;43:2398.

[*128]LehmannV,Go¨seleU.Poroussiliconformation:aquantumwire

effect.ApplPhysLett1991;58:856.

[129]KokerL,KolasinskiKW.Laser-assistedformationofporous

siliconindiversefluoridesolutions:reactionskineticsandmechanisticimplications.JPhysChemB2001;105:38.

[130]ZanoniR,RighiniG,MattognoG,SchironeL,SotgiuG,Rallo

F.X-rayphotoelectronspectroscopycharacterizationofstain-etchedluminescentporoussiliconfilms.JLumin1998;80:159.[131]KellyMT,ChunJKM,BocarslyAB.Highefficiencychemical

etchantfortheformationofluminescentporoussilicon.ApplPhysLett1994;:1693.

[132]JudgeJS.AstudyofthedissolutionofSiO2inacidicfluoride

solutions.JElectrochemSoc1971;118:1772.

[133]SomashekharA,O’BrienS.EtchingSiO2filmsinaqueous0.49%

HF.JElectrochemSoc1996;143:2885.

[134]Osseo-AsareK.Etchingkineticsofsilicondioxideinaqueous

fluoridesolutions:asurfacecomplexationmodel.JElectrochemSoc1996;143:1339.

[135]FrohnhoffS,MarsoM,BergerMG,Tho¨nissenM,Lu¨thH,

Mu¨nderH.Anextendedquantummodelforporoussiliconformation.JElectrochemSoc1995;142:615.

[136]vanBuurenT,DinhLN,ChaseLL,SiekhausWJ,TerminelloLJ.

ChangesintheelectronicpropertiesofSinanocrystalsasafunctionofparticlesize.PhysRevLett1998;80:3803.

[137]VelascoJG.Open-circuitstudyofstainetchingprocessesleading

totheformationofporoussiliconlayers.JElectrochemSoc2003;150:C335.

[**138]NahidiM,KolasinskiKW.Theeffectsofstainetchantcompo-sitiononthephotoluminescenceandmorphologyofporoussilicon.JElectrochemSoc2006;153:C19.

[139]Dimova-MalinovskaD,Sendova-VassilevaM,TzenovN,Kame-novaM.Preparationofthinporoussiliconlayersbystainetching.ThinSolidFilms1997;297:9.

[140]AshrufCMA,FrenchPJ,BressersPMMC,KellyJJ.Galvanic

poroussiliconformationwithoutexternalcontacts.SensActua-torsA1999;74:118.

[141]XiaXH,AshrufCMA,FrenchPJ,KellyJJ.Galvaniccell

formationinsilicon/metalcontacts:theeffectonsiliconsurfacemorphology.ChemMater2000;12:1671.

[*142]LiX,BohnPW.Metal-assistedchemicaletchinginHF/H2O2producesporoussilicon.ApplPhysLett2000;77:2572.

[143]HaradaY,LiX,BohnPW,NuzzoRG.Catalyticamplificationof

thesoftlithographicpatterningofSi.Nonelectrochemicalorthog-onalfabricationofphotoluminescentporousSipixelarrays.JAmChemSoc2001;123:8709.

[144]ChattopadhyayS,LiX,BohnPW.In-planecontrolofmorphol-ogyandtunablephotoluminescenceinporoussiliconproducedbymetal-assistedelectrolesschemicaletching.JApplPhys2002;91:6134.

[145]ChattopadhyayS,BohnPW.Direct-writepatterningofmicro-structuredporoussiliconarraysbyfocused-ion-beamPtdeposi-tionandmetal-assistedelectrolessetching.JApplPhys2004;96:6888.

[146]YaeS,KawamotoY,TanakaH,FukumuroN,MatsudaH.

FormationofporoussiliconbymetalparticleenhancedchemicaletchinginHFsolutionanditsapplicationforefficientsolarcells.ElectrochemCommun2003;5:632.

[147]GorostizaP,Dı

´azR,KulandainathanMA,SanzF,MoranteJR.Simultaneousplatinumdepositionandformationofaphotolu-minescentporoussiliconlayer.JElectroanalChem1999;469:48.

[148]GorostizaP,AnbuKulandainathanM,Dı

´azR,SanzF,AllongueP,MoranteJR.Chargeexchangeprocessesduringtheopen-circuitdepositionofnickelonsiliconfromfluoridesolutions.JElectrochemSoc2000;147:1026.

[*149]GorostizaP,AllongueP,Dı

´azR,MoranteJR,SanzF.ElectrochemicalCharacterizationoftheopen-circuitdepositionofplatinumonsiliconfromfluoridesolutions.JPhysChemB2003;107:54.

[150]HadjersiT,GabouzeN,AbabouA,BoumaourM,CherguiW,

CheragaH,etal.Metal-assistedchemicaletchingofmulticrys-tallinesiliconinHF/Na2S2O8producesporoussilicon.MaterSciForum2005;480–481:139.

[151]MitsugiN,NagaiK.Pitformationinducedbycoppercontam-inationonsiliconsurfaceimmersedindilutehydrofluoricacidsolution.JElectrochemSoc2004;151:G302.

[152]PengK,YanY,GaoS,ZhuJ.Dendrite-assistedgrowthofsilicon

nanowiresinelectrolessmetaldeposition.AdvFuncMater2003;13:127.

[153]PengK-Q,YanY-J,GaoS-P,ZhuJ.Synthesisoflarge-area

siliconnanowirearraysviaself-assemblingnanoelectrochemistry.AdvMater2002;14:11.

[154]PengKQ,HuangZP,ZhuJ.Fabricationoflarge-areasilicon

nanowirep–njunctiondiodearrays.AdvMater2004;16:73.

[**155]PengKQ,WuY,FangH,ZhongXY,XuY,ZhuJ.Uniform,axial-orientationalignmentofone-dimensionalsingle-crystalsiliconnanostructurearrays.AngewChem,IntEdEngl2005;44:2737.[156]TsujinoK,MatsumuraM.Helicalnanoholesboredinsiliconby

wetchemicaletchingusingplatinumnanoparticlesascatalyst.ElectrochemSolidStateLett2005;8:C193.

[157]TsujinoK,MatsumuraM.Boringdeepcylindricalnanoholesin

siliconusingsilvernanoparticlesasacatalyst.AdvMater2005;17:1045.

[158]CruzS,Ho¨nig-d’OrvilleA,Mu¨llerJ.Fabricationandoptimiza-tionofporoussiliconsubstratesfordiffusionmembraneapplica-tions.JElectrochemSoc2005;152:C418.

[159]BenRabhaM,SaadounM,BoujmilMF,Bessaı¨sB,EzzaouiaH,

BennaceurR.Applicationofthechemicalvapor-etchinginpolycrystallinesiliconsolarcells.ApplSurfSci2005;252:488.[160]BenJaballahA,HassenM,HajjiM,SaadounM,Bessaı¨sB,

EzzaouiaH.Chemicalvapouretchingofsiliconandporoussilicon:siliconsolarcellsandmicromachiningapplications.PhysStatusSolidiA2005;202:1606.

[161]BenJaballahA,SaadounM,HajjiA,EzzaouiaH,Bessaı¨sB.

Silicondissolutionregimesfromchemicalvapouretching:fromporousstructurestosilicongrooving.ApplSurfSci2004;238:199.[162]SaadounM,Bessaı¨sB,MlikiN,FeridM,EzzaouiaH,Bennaceur

R.Formationofluminescent(NH4)2SiF6phasefromvapouretching-basedporoussilicon.ApplSurfSci2003;210:240.[163]SaadounM,MlikiN,KaabiH,DaoudiK,Bessaı¨sB,Ezzaouia

H,etal.Vapour-etching-basedporoussilicon:anewapproach.ThinSolidFilms2002;405:29.

[1]KokerL,WellnerA,SherrattPAJ,NeuendorfR,KolasinskiKW.

Laser-assistedformationofporoussiliconindiversefluoridesolutions:Hexafluorosilicatedeposition.JPhysChemB2002;106:4424.

[165]MillsD,KolasinskiKW.Laser-etchedsiliconpillarsandtheir

porosification.JVacSciTechnol,A2004;22:17.

[166]MillsD,NahidiM,KolasinskiKW.Stainetchingofsiliconpillars

andmacropores.PhysStatusSolidiA2005;202:1422–6.

因篇幅问题不能全部显示,请点此查看更多更全内容

Copyright © 2019- huatuo0.cn 版权所有 湘ICP备2023017654号-2

违法及侵权请联系:TEL:199 18 7713 E-MAIL:2724546146@qq.com

本站由北京市万商天勤律师事务所王兴未律师提供法律服务